Radiation-Hardened

Analog & Mixed-Signal IC Solutions

Satellites

Leading-edge Radiation Hardness Assured (RHA) analog and mixed-signal products. Trusted performance and best-in-class SWaP (Size, Weight and Power). Our focus is on mixed-signal sensor paths with growing portfolio of data converters (ADCs/DACs), filters, gain stages and multiplexing.

Triad’s space products provide robust Total Ionizing Dose (TID) and Single Event Effects (SEE) performance. Radiation environment test result reports are available by request from Triad.

Defense Electronics

Designed in cooperation with the Air Force Research Lab (AFRL), Triad’s Radiation Hardened ICs are available in standard product and custom solutions for mission-critical defense applications.

Radiation-Hardened-by-Design

ANNULAR GATE
Use ONLY annular gate N-channel MOSFETs to minimize TID-induced parasitic leakage between the source and drain.  P-channel MOSFETs are immune from this effect.

P+ CHANNEL STOPS
Include P+ channel stops to mitigate TID-induced FOX leakage.

GUARD RINGS
Surround NFET and PFET with a P+ and/or N+ guard rings.  Cover the rings as close to 100% as possible in metal/contacts and connect to the appropriate supply.  Contact metal to the rings at minimum spacing everywhere.

CONSTRAINED WIDTHS
Constrain FET widths to relatively small numbers even for major gate area analog or amp level power drivers (50 µm to 100 µm).

Radiation-Hardened IC Selector Guide

Triad Part NumberDescription
TS4030Radiation-Hardened ADC and DAC
TS4031Radiation-Hardened 64-ch GPIO, 32-ch 10-bit ADC
TS4032Radiation-Hardened 16-Ch Sensor Interface
TS8011Radiation-Hardened 12-bit SAR ADC