Leading-edge Radiation Hardness Assured (RHA) analog and mixed-signal products. Trusted performance and best-in-class SWaP (Size, Weight and Power). Our focus is on mixed-signal sensor paths with growing portfolio of data converters (ADCs/DACs), filters, gain stages and multiplexing.
Triad’s space products provide robust Total Ionizing Dose (TID) and Single Event Effects (SEE) performance. Radiation environment test result reports are available by request from Triad.
Designed in cooperation with the Air Force Research Lab (AFRL), Triad’s Radiation Hardened ICs are available in standard product and custom solutions for mission-critical defense applications.
Use ONLY annular gate N-channel MOSFETs to minimize TID-induced parasitic leakage between the source and drain. P-channel MOSFETs are immune from this effect.
P+ CHANNEL STOPS
Include P+ channel stops to mitigate TID-induced FOX leakage.
Surround NFET and PFET with a P+ and/or N+ guard rings. Cover the rings as close to 100% as possible in metal/contacts and connect to the appropriate supply. Contact metal to the rings at minimum spacing everywhere.
Constrain FET widths to relatively small numbers even for major gate area analog or amp level power drivers (50 µm to 100 µm).